Atomic Force Microscopy: A Powerful Tool for Surface Analysis of Nanostructured Materials

Abstract

Atomic Force Microscopy (AFM) has emerged as a leading technique for the high-resolution characterization of nanostructured surfaces. Its ability to generate three-dimensional topographical maps at the nanoscale enables detailed analysis of surface roughness, texture, morphology, and other critical features that influence the behavior and functionality of advanced materials. This review highlights AFM’s capabilities in measuring nanoscale mechanical properties such as elasticity, adhesion, stiffness, and viscoelasticity using advanced imaging modes like nanomechanical mapping and phase imaging. Recent advancements including the integration of machine learning algorithms for automated image analysis and the use of chemically functionalized probes for site-specific surface interactions are also discussed. Compared to other microscopy techniques, AFM offers distinct advantages, including minimal sample preparation, ambient condition operability, and versatility across material types. This review aims to provide a comprehensive understanding of AFM’s role as a powerful and adaptable tool for surface analysis in nanotechnology and materials science.